Resources & Support
Your Source For Information About Our Ever Changing Industry.
The semiconductor industry is complicated and constantly evolving. CyberOptics Semiconductor continually strives to make important product contributions to advance precision measurement of semiconductor equipment and processes while providing access to current information on a variety of valuable industry subjects.
For technical questions about specific CyberOptics Semiconductor products, please contact technical support.
Organization and Publication Links
Links to websites for prominent organizations and trade publications within the semiconductor industry.
Recent Technical Articles
Allyn Jackson, CyberOptics Field Application Engineer, conducted a presentation on at the 2011 ISMI Manufacturing Week. The presentation, “How to Improve Semiconductor Tool Particle Qualification” Explained the limitations of traditional airborne particle counters. Jackson offered case studies with statistics that compared the WaferSense APS’ performance against bench top and hand helds when performing the same task. Results showed that the APS offered up to a 90% times saving and up to a 20x improvement in throughput as an alternative instrument. Link to presentation
Improving wafer manufacturing in the nanotech age, EuroAsia Semiconductor, Nov 2007
Dennis Bonciolini, Chief Technology Officer, CyberOptics Semiconductor looks at how wafer manufacturing can be improved today by acknowledging legacy inefficiencies and maintaining tighter control on process specifications. Link to the full article
WaferSense® Application Notes
Did you know that fab evaluations of wireless WaferSense® devices indicate ROI is often achieved after a single use?
White Papers & Case Studies
CyberOptics Semiconductor offers downloadable white papers that focus on some of the most significant topics in the semiconductor industry. Subjects include wafer mapping and automatic alignment.
CyberOptics Semiconductor provides answers to the most commonly asked questions about WaferSense precision measurement products and wafer mapping sensors.